EFM mode : The UHV AFM/STM was used in EFM mode (Electrostatic Force Microscopy) for writing and reading on LaTiO3,5 [1], a ferroelectric material. The conductive Si cantilever was prepared by ion sputtering. Using the nanostructuring routines of SCALA, the OMICRON logo was created by domain polarisation with the tip in contact with the surface and a voltage pulse of -8 V applied to the tip for 0.5 msec. |