Multi-Mode AFM/STM at 1000 K

Multi-Mode AFM at 1000 K
At high temperatures the interaction between the Si tip and the highly reactive Si(111) 7x7 surface becomes critical. Stable feedback conditions have been achieved in multi-mode operation, where the frequency shift is measured, and tunneling current is used for distance control. The image was measured at T = 1000 K. (23 x 7.5 nm2 )

 
This result has been obtained with :
Variable Temperature UHV SPM

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SPM