Atomic resolution on Si(111)7x7 in multi-mode AFM

Multi-mode AFM operation : with simultaneous measurement of the topography in STM mode (upper image) with atomic resolution on Si(111)7x7 using a conductive cantilever, and of the atomic scale variation of the force, i.e. cantilever deflection (lower image).

 
This result has been obtained with :
UHV AFM/STM

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SPM