MCP LEED

•	Insulating and delicate surfaces
•	0.1 nA to 30 nA beam current

The MCP-LEED uses a single or double channel plate to allow beam currents down to 0.1 nA for LEED from electrically insulating surfaces.

STRUCTURAL ANALYSIS

STM

MFM

LEED

SPA-LEED

RHEED

SEM

STM/SEM

SNOM

Sample Preparation

EFM

SKPM

Needle Sensor AFM

Low Energy Electron Diffraction (LEED)

MULTIPROBE S
(System Concept & Preparation Chamber Variations)

MULTIPROBE P
(System Concept & Preparation Chamber Variations)

MULTIPROBE XP
(System Concept & Preparation Chamber Variations)

MULTIPROBE RM
(System Concept & Preparation Chamber Variations)

Multi-Chamber System
(System Concept & Preparation Chamber Variations)

MULTIPROBE MXPS
(Dedicated for Spectroscopy)

MULTIPROBE HREELS
(Dedicated for Spectroscopy)

MULTIPROBE LT
(Dedicated for Low Temperatures)

SPECTALEED
(LEED / AES)

MCP LEED
(LEED / AES)

MBD LEED
(LEED / AES)

MULTIPROBE ARUPS
(Dedicated for Spectroscopy)

SPA LEED
(Spot Profile Analysis)

RHEED 20
(Electron Sources)

RHEED 30
(Electron Sources)

SPM PROBE
(Dedicated for SPM)

MBE Systems
(Surface Science Systems)