Print view

STM images of P-passivate Si(100) recorded at 800 K

0014
Author: Deng-Sung Lin et. al.
Publication: Physical Review B Volume 61, Number 4 (2000)
Instrument: UHV STM 1

Interaction of phosphine with Si(100) from core-level photoemission & real-time scanning tunneling microscopy‘

 
Feedback