Scan (and offset) range X/Y/Z:
12 μm x 12 μm x 1.5 μm (VT STM)
10 μm x 10 μm x 1.5 μm (VT AFM)

Corse movement X/Y/Z:
10 mm x 10 mm x 10 mm
step size: 40 nm – 500 nm

Tip/cantilever exchange:
remote controlled tip/cantilever exchange

Z - resolution:
< 0.01 nm

Preamplifier:
vacuum first stage I/V converter with software-controlled gain switch, separate compensation for tunnelling current offset and voltage offset,
capacitive compensation for modulation spectroscopy, maximum bandwidth 80 kHz

Tunnelling current:
< 1pA - 330 nA,

Vibration isolation:
Internal eddy current damping

Gap voltage:
± 5 mV to ± 10 V; applied to tip/cantilever, sample grounded

Maximum bakeout temperature:
170° C (VT STM)
160° C (VT AFM)

Vacuum achievable:
10^-11 mbar range

Sample size:
Max. 11 mm x 11 mm (VT XA series)
Max.  3 mm  x  9 mm or Ø 7 mm (VT series).

Variable temperature operation in microscope stage:
VT series:
- with LHe flow cryostat:
25 K - RT (room temp.) with cooling sample plates
45 K - 750 K with radiative heating,  max. power 7.5 W
45 K - 1500 K with direct current heating, maximum current 1.8 A, maximum
power 7.5 W)

- with LN₂ bath cryostat:
100 K with cooling sample plates
120 K - 750 K (radiative heating, max. power 7.5 W)
120 K - 1500 K (direct current heating, max. current 1.8 A, max. power 7.5 W)

VT XA Series:
- with LHe flow cryostat:
50 K - 500 K / 650 K*

- with LN₂ bath cryostat:
100 K - 500 K / 650 K*

*heating version only
Max. heating power allowed in stage: 7.5 W
Max. heating current allowed in stage: 0.5 A

Flow cryostat (LHe, LN₂):
resolution (with temperature controller) < 0.02 K,
drift at sample < 0.1 K/hr.
LHe consumption typically 1 l/hr.
Initial cool-down time < 0.5 hr.
Integrated counter - heating element for temperature control.

LN₂ bath cryostat:
Intial cool-down time < 1 hr (for equilibrium),
< 0.5 hr. after refill.
Capacity 1.6 l, duration 8 hr. typical
Stability (at sample) < 1 K/hr.

Options:
QPlus AFM operation
Optical microscope for probe navigation
Ballistic electron emission microscopy (BEEM)
Tip Preparation Tool
Sample reception stage for 4 sample contacts (VT XA Series)
Two additional electrical contacts (VT Series)
Temperature readout at the sample (VT Series)
E-beam heating sample plates (VT Series)
Cleaving sample plates(VT Series)

Note: Specifications and descriptions contained in this website are subject to alteration without notice. For guaranteed specifications please inquire official documentation.