The Large Sample SPM uses the latest preamplifier technology for true sub-pA scanning tunnelling microscopy and spectroscopy. Low currents are important for work on low conductive or sensitive surfaces. For modulation spectroscopy an electronic compensation reduces the influence of parasitic currents. This saves acquisition time and improves results.

The AFM Technology of the Variable Temperature SPM is based on more than 20 years of experience in Atomic Force Microscopy in UHV. It has been continuously developed and improved. The classical Beam Deflection AFM for contact and non-contact AFM offers the flexibility for many operational modes and different cantilever types. For example high resolution AFM, Friction Force Microscopy, Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM) and Magnetic Force Microscopy (MFM) are available. The bandwidth of the AFM signal detection has been increased to 2 MHz to allow the use of stiff cantilevers and operation at higher resonance modes. The new “QPlus” sensor, based on a tuning fork design, is today extending the possible application range of the Large Sample SPM.

In-situ tip exchange is crucial for flexible UHV scanning probe microscopy. The different sensors are exchanged by remote-control using Omicron’s patented piezo-inertia coarse positioning drives. A sensor is transferred through the UHV system on a transfer plate with a ‘keyhole‘ cut-out. It is picked up by the scanner under user-driven remote-control, minimizing the risk of mechanical damage.