Low Temperature ³He & ⁴He SPM Operation in High Magnetic Fields

• Low temperatures of below 500 mK
• High magnetic fields of up to 12 T
• Cryostat hold time of up to 160 h
• Continuous SPM operation during magnetic field variation
• Spring suspension for mechanical decoupling between cryostat and microscope

Low Temperature UHV STM and AFM Technology

• Low Temperature Operation at T < 5 K
• Lowest Thermal Drift & Highest Stability
• Ultimate STM/STS/IETS Performance
• Leading QPlus AFM Technology
• Variable Temperature Operation
• Guided 3D Coarse Positioning
• 50 Hours LHe Hold Time & Fast Cool Down
• Safe & Quick Sample/Tip Exchange

AFM Benchmark Performance

• Atomic Resolution AFM at the Highest Performance Levels
• High Bandwidth for Working at High Frequencies
• Simultaneous STM & STS
• QPlus AFM from 5 K to 300 K with the LT STM
• QPlus AFM from 25 K to > 1000 K with the VT SPM Series

The legendary STM developed by Omicron.

• Unsurpassed stability and resolution
• Eddy current damping
• UHV sample/tip exchange
• In-vacuum I/V converter

Benchmarking UHV STM and AFM Technology

• 25K – 1500 K
• True pA STM
• Improved dI/dV Spectroscopy
• Beam Deflection AFM
• QPlus AFM
• In-situ Evaporation

Benchmarking UHV STM and AFM Technology - The VT XA Series

• 50 K – 500 K / 650 K
• True pA STM
• Improved dI/dV Spectroscopy
• Beam Deflection AFM
• QPlus AFM
• In-situ Evaporation

Ultimate Probing at the Nanoscale

• Four Fully Independent Scanning
• Tunnelling Microscopes
• 4-Point Transport Measurements
• Excellent STM Performance for Spectroscopy and Manipulation
• Base Temperature T < 5 K
• High Resolution SEM Navigation

Scanning Auger with Ultimate Resolution

• 5 nm SAM Resolution
• 3 nm SEM Resolution
• Depth Profi ling and Charge Neutralisation
• Additional Techniques: EBSD, SEMPA, FIB, EBL

Four Independent Scanning Probe Microscopes

• 4-Point Transport Measurements on Nanostructures
• Electrical Contacting of Nanodevices
• STM-Based Safe & Non-Destructive Tip Approach
• Full STM Capability
• High-Resolution, < 4 nm SEM Imaging for Rapid Tip Navigation
• High-Resolution, < 10 nm SAM Imaging for Chemical Mapping
• True UHV Operation for Clean & Artefact-Free Surfaces

Imaging XPS and Small Spot Spectroscopy

• ESCA Lateral Resolution
• 150 nm with Synchrotron Raditation
• 650 nm Resolution with Al Kα
• Survey Images with < 50 nm PEEM Resolution
• Aberration Corrected Energy Filter
• High Power Monochromatic X-ray Source

Nanotechnology is our profession!

• Scanning Probe Microscopy
• Electron Spectroscopy
• Thin Film Solutions
• Tailored UHV Systems
• Nanoprobing & Nanotools

Thin Film Metrology

• Atomic Layer Deposition (ALD) provides 'self terminating', controlled ultra-thin film growth
• Precise measurement of thickness, composition & uniformity of ultra-thin films
• Advanced growth & process control for rapid prototyping
• In-vacuum wafer transfer from deposition to analysis for rapid characterisation
• Combination of different deposition processes without capping/de-capping steps
• Direct correlation of process parameters to chemical composition

...with ESCA+ and Multiprobe Thin-Film Technology.

• Measurement of composition, uniformity & thickness of ultra-thin films
• Advanced growth & process control for rapid prototyping
• Rapid identification of films without transfer from UHV

EV0-25 and EVO-50 MBE System:

• Standard System with Preparation/Storage
• Chamber and with Loadlock Chamber

LAB-10 MBE System: Standard System with Preparation/Storage Chamber and with Loadlock Chamber

PR0-75 and PRO-100 MBE System: Standard System with Preparation/Storage Chamber and with Loadlock Chamber

LAB-10 MBE System
EVO-25 /-50 MBE System
PRO-75 /-100 MBE System

• Growth System Solutions for all Fields of Application
• Layer Growth with Outstanding Performance
• Excellent Sample Thickness & Doping Homogenity
• Low Background Doping Level
• Very Low Defect Density
• Excellent Carrier Density & Mobility
• Installation & Customer Training by Experienced MBE-Engineers

A Family of Multi-Technique Surface

• Science Systems - Single Supplier, Total Support for Multiple Techniques
• Flexible, Turn-Key UHV Systems
• Designed According to Customer’s Requirements

The ability to manage of huge amounts of data sets
is crucial for successful research work! Simply use
the MATRIX software tool ‘Vernissage‘ for this job.

The AFM controller with digital PLL is an integral solution for the MATRIX control system and a perfect match with Omicron‘s SPM instrumentation.

Standard routines in AFM and STM permit a large series of predifined experiments.

• Uses Image Correlation Technique
• Tunable
• Virtually no Drift!

• Intuitive User Interface
• Digital Control & Low Noise
• 24 Bit z Resolution
• Easy Result Management with ‚Vernissage‘
• Program Interfaces for User Specific Applications

The MATRIX Control system is the combined result of Omicron‘s experience over more than 25 years in the SPM field and the incorporation of user feedback into the design.

• Remote Access
• User Modifications
• Scripting and/or LabVIEW
  
  

The concept of digital control of the MATRIX Control System offers predefined procedures for manipulation but also the flexibility for user specific programmable interactions.

Many-body effects in electronic bandgaps of carbon nanotubes measured by scanning tunnelling spectroscopy.

• Single Point-, Grid- and User Specific Spectroscopy
• Multiple Curves, Averaging & Reversal Ramp
• Dual Mode
• Varied Z-Spectroscopy

• Two independent feedback loops
• Seamless transition
• Mixing of signals

Omicron‘s patented fi ne positioning technology, developed for use under the stringent conditions of ultra-high vacuum, has proven its ability to perform with accuracy and reliability in countless exacting applications in laboratories throughout the world.

Various topics

High-performance technology products for research and industry.